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Research article

First published 2022-1

Improving the transmission error source tracing method for gear hobbing machines

Wanhua Zhao, Zhuang Liu, Yong Yang [...]

Advances in Mechanical Engineering

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Research article

First published 1974-4

The Clinical Significance of Tracing Error in Cephalometry

J. F. Gravely, P. Murray Benzies

Journal of Orthodontics

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Research article

First published 2024-4

Wear characteristics analysis of variable hyperbolic circular-arc-tooth-trace cylindrical gear transmission considering assembly error theory

Yongqiao Wei, Dong Yang, Rui Guo [...]

Proceedings of the Institution of Mechanical Engineers,Part J: Journal of Engineering Tribology

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Research article

First published 2024-5

Geometric contact characteristics of variable hyperbolic circular-arc-tooth-trace cylindrical gear under different machine tool errors and sensitivity analysis for impact factors

Yongqiao Wei, Yue Wang, Zeyu Li [...]

The Journal of Strain Analysis for Engineering Design

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Research article

First published 1998-9

Error bound in trace norm for Trotter–Kato product formula of Gibbs semigroups

Takashi Ichinose, Hideo Tamura

Asymptotic Analysis

Open access

Research article

First published 2017-7

A geometric error tracing method based on the Monte Carlo theory of the five-axis gantry machining center

Jinwei Fan, Yuhang Tang, Dongju Chen [...]

Advances in Mechanical Engineering

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Research article

First published 2023-6

Smart Error Sum Based on Hybrid Two-Trace Two-Dimensional (2T2D) Correlation Analysis

Thomas G. Mayerhöfer, Marie Richard-Lacroix, Susanne Pahlow [...]

Applied Spectroscopy

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Research article

First published 1988-5

Reproducibility of Cephalometric Measurements

P. J. Sandler

Journal of Orthodontics

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Research article

First published 2025-1

Dispersion Analysis of Perpendicular Modes Using a Hybrid Two-Trace Two-Dimensional (2T2D) Smart Error Sum

Thomas G. Mayerhöfer, Isao Noda, Jürgen Popp

Applied Spectroscopy

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Research article

First published 2003-6

Error Analysis for Estimation of Trace Vapor Concentration Pathlength in Stack Plumes

Neal B. Gallagher, Barry M. Wise, David M. Sheen

Applied Spectroscopy

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