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Research article

First published 1975-7

Integral Reflection Coefficient of X-ray Spectrometer Crystals

J. V. Gilfrich, D. B. Brown, P. G. Burkhalter

Applied Spectroscopy

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Research article

First published 1985-1

Spectral Efficiency of the SpectraSpan III Echelle Grating Spectrometer

Andrew T. Zander, Myron H. Miller, Martha S. Hendrick [...]

Applied Spectroscopy

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Research article

First published 2019-2

The machining characteristics and surface integrity of Ni-rich NiTi shape memory alloy using wire electric discharge machining

Himanshu Bisaria, Pragya Shandilya

Proceedings of the Institution of Mechanical Engineers,Part C: Journal of Mechanical Engineering Science

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Research article

First published 1985-9

Theory of Holographic Relaxation Spectroscopy with Nonsinusoidal Gratings

John H. Shibata, Charles S. Johnson

Applied Spectroscopy

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Research article

First published 2011-3

Introducing Higher Order Diffraction into Beam Tracing Based on the Uncertainty Relation

Uwe M. Stephenson

Building Acoustics

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Research article

First published 1996-2

Luminosity of Bragg Crystal Diffraction Spectrometers with Flat and Focusing Crystals

U. Lehnert, G. Zschornack

Journal of X-Ray Science and Technology

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Research article

First published 1995-5

Theoretical and Experimental Investigation of X-Ray Diffraction by a Lamellar Multilayer Amplitude Grating

S. Bac, P. Troussel, A. Sammar [...]

Journal of X-Ray Science and Technology

Free access

Research article

First published 2016-6

Accuracy and efficiency analysis of a road traffic noise propagation calculation method based on beam tracing

Haibo Wang, Zhi Yu, Ming Cai

Journal of Low Frequency Noise,Vibration and Active Control

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Research article

First published 2009-3

A Green Efficient Synthesis of spiro[indoline-3,4′(1 H ‘)-pyrano [2,3- c ]pyrazol]-2-one derivatives

Ying Liu, Dong Zhou, Zhongjiao Ren [...]

Journal of Chemical Research

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Research article

First published 1991-2

Characterization of a Multilayer Coated Laminar Reflection Grating at λ = 0.154 nm

E. J. Puik, M. J. van der Wiel, P. Lambooy [...]

Journal of X-Ray Science and Technology

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