Abstract
Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.
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References
1.
Birks
L. S.
, X-Ray Spectrochemical Analysis (Wiley-Interscience , New York , 1969 ), 2nd ed. , p. 37 .
2.
Brown
D. B.
and
Fatemi
M.
, J. Appl. Phys. 45 , 1544 (1974 ); ibid. , with
Birks
L. S.
, p. 1555 .
3.
Vierling
J.
Gilfrieh
J. V.
, and
Birks
L. S.
, Appl. Spectrosc. 23 , 342 (1969 ).
4.
(a)
Compton
A. H.
and
Allison
S. K.
, X-Rays in Theory and Experiment (Van Nostrand Co. , Princeton, N. J. , 1935 ), p. 709 .
5.
(b)
Birks
L. S.
Hurley
J. W.
, and
Sweeney
W. E.
, J. Appl. Phys. 36 , 3562 (1965 ).
6.
(c)
Sandelin
J. W.
and
Birks
L. S.
, Trans. Met. Soc. AIME 239 , 1269 (1967 ).
7.
Compton
A. H.
and
Allison
S. K.
, X-Rays in Theory and Experiment (Van Nostrand Co. , Princeton, N.J. , 1935 ), p. 398 .
8.
Burek
A. J.
Barrus
D. M.
, and
Blake
R. L.
, Astrophys. J. 191 , 533 (1974 ).
9.
Hope
H.
, Acta Crystallogr . A27 , 392 (1971 ).
10.
Brown
D. B.
and
Gilfrieh
J. V.
, J. Appl. Phys. 42 , 4044 (1971 ).
11.
Birks
L. S.
and
Seal
R. T.
, J. Appl. Phys. 28 , 541 (1957 ).