X-Ray Diffraction Comparator - New Possibilities

Abstract

We have studied the possibilities to determine precisely the lattice constants of quartz using an X-ray diffractometer-comparator. This device has double-crystal optical scheme, continuously swinging crystal-monochromator and an original angular reference system. The measurement strategy uses the difference in angular positions of two different Bragg planes relative the third one. On assumption that the wavelength of the used radiation is known with accuracy of ± 1.2,ppm, the accuracy of determined lattice constants is estimated in ± 5×10^-5Å. The described measurement strategy proves to be efficient in measuring the changes of the lattice constants with temperature and in precision testing of a quartz single-crystal homogeneity. We discuss also the features of other instruments for the automatic sorting of quartz blanks in groups by the cut angle, which use the same monochromator pendulum system.