Abstract
We tested the X-ray monochromatic single crystal imaging method proposed by Fraenkel and Kalman (B. S. Fraenkel and Z. H. Kalman, Physica Scripta 41, 400 (1990)) on the basis of combined polarization factors. We performed dynamical calculation of the angular distribution of intensity of the imaging reflection. It was verified that the polarization of the incident wave has really a decisive role for an applicability of the method. An integrated intensity procedure was developed for simulating the conditions during practical imaging. Its applicability is examined in detail for three cases of multiple diffraction with the primary reflection 420 in Ge crystal. Only two cases of the three mentioned showed to be adjustable, producing sufficiently sharp image. A contrast of the image of the adjusted crystal on background level was calculated for those two cases.
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