The synthesis,characterization and phase stability of tin sulfides (SnS 2,SnS and Sn 2 S 3 ) films deposited by ultrasonic spray

Abstract

In this study, we will deal with the influences of deposition time on structural, optical and electrical properties of Sn_xS_y films which have grown through ultrasonic spray technique. The Sn_xS_y thin films are deposited on glass substrate at 300°C with a deposition time of t = 2 min-10 min, using two precursors: tin (II) chloride and tin (IV) chloride, respectively. The obtained films were characterized by X-ray diffraction (XRD), The UV–VIS–NIR optical transmittance measurements and the electrical resistivity by four -points. The X-ray diffraction (XRD) analysis of Sn_xS_y films indicates three phases of SnS₂, SnS and Sn₂S₃ phases crystallites. In addition, this analysis revealed that SnS₂ phase stability is superior than SnS and Sn₂S₃ stability. The results of (UV) spectroscopy visible spectrum demonstrate that films deposited at 10 min are low transmittance in the visible region for two precursors, and a direct band gap found to decrease with increase in deposition time. Electrical measurements indicate that the resistivity behavior depends on the used precursors and deposition time.

Keywords

stability tin sulfide ultrasonic spray deposition time precursors

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