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Abstract

An icing chamber employing a closed-cycle helium cryostat has been fabricated for Raman microprobe spectroscopy of the icing on electrical transmission cable samples. A thick layer of ice deposited on a cable sample at low temperature (30 K) evaporates gradually under vacuum by increasing the temperature at intervals of 10 K up to 180 K. The Raman spectra of the gradually thinning ice layer obtained in the O-H stretching region reveals the layer-by-layer structure of ice. The study suggests that the structure of the initial ice changes from low-density amorphous ice at low temperatures to high-defect-density polycrystalline ice at higher temperatures. This observation, made for the first time on electrical transmission cable samples, is consistent with the observed phase diagram of bulk amorphous ice.

Keywords

Ice mechanics and physics Raman spectroscopy Physical vapor deposition

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