Layered synthetic microstructures (LSM's) are useful dispersing devices for x-ray spectroscopy. They can be produced with virtually any layer spacing (d) greater than approximately 10 Å and they have high diffraction efficiency. Integral reflection coefficients for such structures made up of alternating layers of a transition metal and carbon are 3 to 10 times greater than values for other dispersing elements used in the moderate to long wavelength region of the x-ray spectrum. Resolving power of the LSMs is somewhat poorer than crystals at this time but is sufficient to permit significant applications.
GouldR. W.BatesS. R., and SparksC. J., Appl. Spectrosc.22, 549 (1968).
2.
HenkeB. L. and TesterM. A., “Techniques of low energy x-ray spectroscopy,” in Advances in X-Ray Analysis, PicklesW. L.BarrettC. S.NewkirkJ. B., and RuudC. O., Eds. (Plenum Press, New York, 1975), Vol. 18, pp. 87–97.
3.
DeubnerW., Ann. der Phys.5, 261 (1930).
4.
DuMondJ. and YoutzJ. P., J. Appl. Phys.11, 357 (1940).
5.
DinklageJ., J. Appl. Phys.38, 3781 (1967).
6.
SpillerE., Appl. Opt.15, 2333 (1976).
7.
BarbeeT. W.Jr. and KeithD. C., “Synthetic structures layered on the atomic scale,” in Workshop on X-Ray Instrumentation for Synchrotron Radiation Research (WinickH. and BrownG., Eds. Stanford Synchrotron Radiation Laboratory Report No. 78/04, p. III-26 (May 1978).
8.
SchullerI. K., Phys. Rev. Lett.44, 1597 (1980).
9.
SpillerE.SegmullerA.RifeJ., and HaelbichR. P., Appl. Phys. Lett.37, 1048 (1980).
10.
BarbeeT. W.Jr., Proceedings of Topical Conference on Low Energy X-Ray Diagnostics, in AttwoodD. T. and HenkelB. L., Eds. (American Institute of Physics, New York, 1981).
11.
UnderwoodJ.BarbeeT. W., and KeithD. C., SPIEVol. 184 Space Optics-Imaging X-Ray Optics Workshop (1979), p. 123.
12.
GilfrichJ. V.BrownD. B., and BurkhalterP. G., Appl. Spectrosc.29, 322 (1975).
13.
UnderwoodJ. H. and BarbeeT. W.Jr., Appl. Opt.20, 3027 (1981).
14.
BrownD. B., Naval Research Laboratory, private communication (1981).
15.
LoterN. G.NagelD. J., and BarbeeT. W.Jr., unpublished data (1981).
16.
NagelD. J.GilfrichJ. V.LoterN. G., and BarbeeT. W.Jr., “X-ray optical instruments employing layered synthetic microstructures.”Proceedings of the International Conference on X-Ray Processes and Inner Shell Ionization, 25–29 August 1980, Stirling, Scotland, in press.
17.
NagelD. J.GilfrichJ. V. and BarberT. N.Jr., Nucl. Instr. and Methods, in press (1982).
