Calculation methods for quantitative analysis, energy dispersion, and inhomogeneous samples are current areas in x-ray analysis which offer hope of reducing analysis costs. Other areas which extend the capabilities of x-ray analysis include improved analyzer crystals, diffraction gratings, and effects of valence on spectral lines. Electron spectrometry promises to be a valuable technique for low atomic number elements.
CrissJ. W. and BirksL. S., Anal. Chem.40, 1080 (1968).
2.
McMasterW. H., Compilation of X-Ray Cross Sections, U. of Cal., Lawrence Rad. Lab. Rep. UCRL-50174, 1967; see also, HeinrichK. F. J., The Electron Microprobe, McKinleyT. D., Eds. (John Wiley & Sons, Inc., New York, 1966), p. 296.
3.
FinkR. W.JopsonR. C.MarkH., and SwiftC. D., Rev. Mod. Phys.38, 513 (1966).
4.
BirksL. S.LabrieR. J., and CrissJ. W., Anal. Chem.38, 701 (1966).
5.
BirksL. S. and BattA. P., Anal. Chem.35, 778 (1963).
6.
FitzgeraldR.KeilK., and HeinrichK. F. J., Science159, 528 (1968).
7.
RhodesJ. R. and FurutaT., Advan. X-Ray Anal. (Plenum Press, Inc., New York, 1968), Vol. 11, p. 249.
8.
BerryP. F.FurutaR.RhodesJ. R., Advan. X-Ray Anal. (Plenum Press, Inc., New York, 1969), Vol. 12.
9.
ClaisseF. and SampsonC., Advan. X-Ray Anal., 5 (Plenum Press, Inc., New York, 1961), p. 535.
10.
CrissJ. W., Toronto Spectroscopy Sympsoium, 1968 (to be published).
11.
VierlingJ. S.GilfrichJ. V., and BirksL. S., Pitt. Diff. Conf., Pitt. Pa., Nov. 1967 (to be published).
12.
GouldR. W.BatesS. R., and SparksC. J., Appl. Spectry.22, 549 (1968).
13.
OHM is octadecyl hydrogen maleate and is available from Isomet Corp., Palisades Park, N. J.
14.
FranksA. and LindseyK., The Electron Microprobe, McKinleyT. D., Eds. (John Wiley & Sons, Inc., New York, 1966), p. 83.
15.
NicholsonJ. B. and HaslerM. F., Advan. X-Ray Anal. (Plenum Press, Inc., New York, 1966), Vol. 9, p. 240.
16.
FischerD. W. and BaunW. L., J. Appl. Phys.38, 229 (1967).
17.
HenkeB. L., J. Appl. Phys.37, 922 (1966).
18.
HollidayJ. E., The Electron Microprobe, McKinleyT. D., Ed. (John Wiley & Sons, Inc., New York, 1966), p. 3.
19.
HagstromS.NordlingC., and SiegbahnK., Phys. Letters9, 235 (1964).
20.
HarrisL. A., J. Appl. Phys.39, 1419 (1968); Anal. Chem.40, 24A (1968).
21.
HenkeB. L., Proc. 7th National Soc. Appl. Spect. Meeting, Chicago, Ill. (May 1968).
