Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements correctly, a mathematical analysis of the measuring method has been established. From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction.
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