Search results: Sage Journals

Restricted accessResearch articleFirst published November, 1993

Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition

Qiang Fan, Yohich Gohshi

Applied Spectroscopy

Restricted accessResearch articleFirst published November, 2001

Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure

Patrick J. McNally, G. Dilliway, J.M. Bonar [...]

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published November, 2014

Total Reflection X-ray Spectrometry (TXRF) for Trace Elements Assessment in Edible Clams

Eva Marguí, Alexandra de Fátima Marques, Maria de Lurdes Prisal [...]

Applied Spectroscopy

Restricted accessResearch articleFirst published July, 1997

Direct Analysis of Silicon Carbide Powder by Total Reflection X-Ray Fluorescence Spectrometry

I. Csató, GY. Záray, K. Gál-Solymos [...]

Applied Spectroscopy

Restricted accessResearch articleFirst published November, 1995

Multiple Reflections in Single Crystals as a Tool for X-Ray Spectroscopy

Benjamin S. Fraenkel

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published July, 1975

Integral Reflection Coefficient of X-ray Spectrometer Crystals

J. V. Gilfrich, D. B. Brown, P. G. Burkhalter

Applied Spectroscopy

Free accessResearch articleFirst published January, 2019

Method for measurement of serum copper,zinc and selenium using total reflection X-ray fluorescence spectroscopy on the PICOFOX analyser: Validation and comparison with atomic absorption spectroscopy and inductively coupled plasma mass spectrometry

Jinny Jeffery, Amy R Frank, Stephanie Hockridge [...]

Annals of Clinical Biochemistry: International Journal of Laboratory Medicine

Restricted accessResearch articleFirst published August, 1996

Effects of a Near-Surface Transition Layer on X-Ray Reflection and Scattering

Igor A. Artioukov, Viktor E. Asadchikov, Igor V. Kozhevnikov

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published February, 2016

Identification of Historic Artists' Pigments Using Spectral Reflectance and X-Ray Diffraction Properties I. Iron Oxide and Oxy-Hydroxide-Rich Pigments

Edward Cloutis, Alesha MacKay, Leif Norman [...]

Journal of Near Infrared Spectroscopy

Restricted accessResearch articleFirst published February, 1993

The Anisotropy of X-Ray Reflection and Scattering from Hexagonal BN

E. O. Filatova, T. A. Blagoveshchenskaya

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published November, 1993

Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition

Qiang Fan, Yohich Gohshi

Applied Spectroscopy

Restricted accessResearch articleFirst published November, 2001

Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure

Patrick J. McNally, G. Dilliway, J.M. Bonar [...]

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published November, 2014

Total Reflection X-ray Spectrometry (TXRF) for Trace Elements Assessment in Edible Clams

Eva Marguí, Alexandra de Fátima Marques, Maria de Lurdes Prisal [...]

Applied Spectroscopy

Restricted accessResearch articleFirst published July, 1997

Direct Analysis of Silicon Carbide Powder by Total Reflection X-Ray Fluorescence Spectrometry

I. Csató, GY. Záray, K. Gál-Solymos [...]

Applied Spectroscopy

Restricted accessResearch articleFirst published November, 1995

Multiple Reflections in Single Crystals as a Tool for X-Ray Spectroscopy

Benjamin S. Fraenkel

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published July, 1975

Integral Reflection Coefficient of X-ray Spectrometer Crystals

J. V. Gilfrich, D. B. Brown, P. G. Burkhalter

Applied Spectroscopy

Free accessResearch articleFirst published January, 2019

Method for measurement of serum copper,zinc and selenium using total reflection X-ray fluorescence spectroscopy on the PICOFOX analyser: Validation and comparison with atomic absorption spectroscopy and inductively coupled plasma mass spectrometry

Jinny Jeffery, Amy R Frank, Stephanie Hockridge [...]

Annals of Clinical Biochemistry: International Journal of Laboratory Medicine

Restricted accessResearch articleFirst published August, 1996

Effects of a Near-Surface Transition Layer on X-Ray Reflection and Scattering

Igor A. Artioukov, Viktor E. Asadchikov, Igor V. Kozhevnikov

Journal of X-Ray Science and Technology

Restricted accessResearch articleFirst published February, 2016

Identification of Historic Artists' Pigments Using Spectral Reflectance and X-Ray Diffraction Properties I. Iron Oxide and Oxy-Hydroxide-Rich Pigments

Edward Cloutis, Alesha MacKay, Leif Norman [...]

Journal of Near Infrared Spectroscopy

Restricted accessResearch articleFirst published February, 1993

The Anisotropy of X-Ray Reflection and Scattering from Hexagonal BN

E. O. Filatova, T. A. Blagoveshchenskaya

Journal of X-Ray Science and Technology