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Research article

First published 2021-4

Investigating semiconductor device characterization in educational labs

T Nethra Devi, TR Raghuram

International Journal of Electrical Engineering & Education

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Research article

First published 1991-03

Stability,Electronic Structure,and Phase Diagrams of Novel Inter- Semiconductor Compounds

L.G. Ferreira, S.-H. Wei, Alex Zunger

The International Journal of High Performance Computing Applications

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Research article

First published 2005-11

Read-Noise Characterization of Focal Plane Array Detectors via Mean-Variance Analysis

R. P. Sperline, A. K. Knight, C. A. Gresham [...]

Applied Spectroscopy

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Research article

First published 2000-3

Millimeter-wave semiconductor two-port network at 77K

Sharif Iqbal Sheikh

International Journal of Applied Electromagnetics and Mechanics

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Research article

First published 1993-11

Room-Temperature Measurement of Photoluminescence Spectra of Semiconductors Using an FT-Raman Spectrophotometer

J. D. Webb, D. J. Dunlavy, T. Ciszek [...]

Applied Spectroscopy

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Research article

First published 1998-12

Application of Thermosetting Copolyimides as Coatings for Protection of Semiconductor Devices

Nobuyuki Furukawa, Hisashi Katayama, Ken-Ich Kitamura

High Performance Polymers

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Other

First published 1999-07

Properties of Metal-Polyaniline Schottky Barriers

M. Campos, Braz Bello

Polymers and Polymer Composites

Open access

Research article

First published 2024-12

Strained Silicon Technology: Non-Destructive High-Lateral-Resolution Characterization Through Tip-Enhanced Raman Spectroscopy

Giancarlo La Penna, Chiara Mancini, Anacleto Proietti [...]

Applied Spectroscopy

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Research article

First published 2004-2

Deep-Ultraviolet Raman Microspectroscopy: Characterization of Wide-Gap Semiconductors

Shin-Ichi Nakashima, Hazime Okumura, Taketsugu Yamamoto [...]

Applied Spectroscopy

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Research article

First published 2021-12

Structural characterization of semiconductor multi-layer pad

Michele Calabretta, Alessandro Sitta, Salvatore Massimo Oliveri [...]

Proceedings of the Institution of Mechanical Engineers,Part C: Journal of Mechanical Engineering Science

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