Limited-angle CT scan is an effective way for nondestructive inspection of planar objects, and various methods have been proposed accordingly. When the scanned object contains high-absorption material, such as metal, existing methods may fail due to the beam hardening of X-rays. In order to overcome this problem, we adopt a dual spectral limited-angle CT scan and propose a corresponding image reconstruction algorithm, which takes the polychromatic property of the X-ray into consideration, makes basis material images free of beam hardening artifacts and metal artifacts, and then helps depress the limited-angle artifacts. Experimental results on both simulated PCB data and real data demonstrate the effectiveness of the proposed algorithm.
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