Abstract
This paper describes an X-ray imaging architecture, called electronic planar laminography, that utilizes a time delay and integration (TDI) detector to provide laminographic cross-sectional images without recourse to a mechanically moving scintillator. Advantages in system performance and reduced complexity may be achieved in comparison with current scanned-beam laminographic systems. The architecture additionally allows for both two-dimensional radiography and digital reconstruction techniques. Any practical system design must make a number of trade-offs, such as between resolution and throughput. These trade-offs are elucidated through consideration of different design examples.
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