Abstract
10 mentally retarded and 10 age-matched nonretarded (normal) Ss were tested under two conditions of backward visual masking: with a homogeneous masking flash and with a pattern masking flash. The results showed that retardates had higher thresholds (impaired detection of the test flash) than nonretardates under both masking conditions, but especially with the pattern masking flash. These results are interpreted in light of published reports that masking with a homogeneous flash occurs peripherally, while masking with a pattern flash occurs centrally. Hence, the inferior performance of retardates under conditions of pattern masking implies primarily central perceptual deficits. In addition, evidence is presented that such deficits may be related to the actual degree of intellectual ability.
Get full access to this article
View all access options for this article.
