Effects of Transverse G-Stress on Running Memory

Abstract

A 2-channel running memory task with 2 random binary series as stimuli was used to test Ss under 4 levels of transverse G-stress. No memory deficit was found at 3G. Significant memory deficit was found at 5G and 7G with still greater deficit at 9G. Most of the deficit occurred during the latter half of each 2-min. and 18-sec. stress-period. Serial-order error ranking for retained symbols was similar for both stress and non-stress performance, but stress increased error for all serial orders. However, stress vs non-stress differences were found in serial orders that included a previously correct symbol that S had to disregard. This irrelevant symbol was an important error factor in non-stress performance but not in stress performance where S curtailed the number of symbols he processed each trial.