Abstract
We have designed and tested a spectral infrared emissivity device (SIRED) for studying the FT-IR emission spectra of solid surfaces. The cell, which is commercially available, can be used from near room temperature to 400°C. Emissivity results obtained by SIRED for several common laboratory samples compare well to published values for similar materials. As an example of another measurement using SIRED, we show results for the evaluation of the plasma wavelength of a semiconductor.
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