The effects of chromic/sulfuric acid etchant on thin polyethylene films are being studied by Raman spectroscopy. The functional groups on the surface of the etched films were found to differ from those present in the bulk. Cr-O bands appeared in both the bulk and SERS spectra, and sulfate species were detected on the surface only. The ability to differentiate between the surface and bulk polymer chemistry of CrO3/H2SO4-etched polyethylene using surface-enhanced Raman spectroscopy is demonstrated.
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