Application of Target Partial Least Squares for Analysis of Fourier Transform Infrared—Attenuated Total Reflection Hyperspectral Images for Characterization of the Distribution of Crop Protection Products on the Leaf Surface
Restricted accessResearch articleFirst published online September, 2009
Application of Target Partial Least Squares for Analysis of Fourier Transform Infrared—Attenuated Total Reflection Hyperspectral Images for Characterization of the Distribution of Crop Protection Products on the Leaf Surface
Target partial least squares (PLS) is applied to Fourier transform infrared–attenuated total reflection (FT-IR-ATR) hyperspectral images of plant leaf surface treated with crop protection products. Detection of active ingredient is demonstrated at application rates of 50 g active ingredient per hectare. This sensitivity could not be achieved without the application of multivariate analysis. Quantitative information appears to be easily recovered through analysis of combined images with known and unknown amounts of active ingredient.
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