Profilometry by projecting sinusoidal stripe patterns with motion blurring

Abstract

This paper proposes a method of projecting sinusoidal fringe patterns for measuring a three-dimensional shape. In the proposed method, fringe patterns are plated on a piece of glass with chromium, and each stripe of the fringe pattern is composed of small sinusoidal segments. The glass is placed on the image plane of an optical projection system. By linearly moving the glass along the direction of the stripe pattern, the projection system generates the motion-blurring phenomenon, and as a result, produces a blurred-stripe pattern whose intensity profile is sinusoidal along the direction perpendicular to the stripe pattern. Experimental results are provided for three different types of fringe patterns: rectangle, diamond, and sinusoid. Sinusoidal phase-shifted patterns generated by the proposed method produce smaller phase angle errors.