A theoretical expression that describes the influence of instrumental errors in the determination of residual stress by energy-dispersive X-ray diffraction (EDXRD) is derived. The calculation predicts the shift in the diffraction peak energy with variation in the angle Ψ as a function of the misalignment parameters. A simple model that allows evaluation and monitoring of instrumental adjustment for residual stress measurements by EDXRD is shown. Good agreement between experimental and theoretical data is obtained using the model developed.
FennR. H.JonesA. M.The effect of sample position on the determination of triaxial stress by X-ray diffractionJ. Appl. Crystallogr., 1988, 21, 38–40.
2.
NoyanI. C.CohenJ. B.Residual Stress Measurement by Diffraction and Interpretation, 1987 (Springer-Verlag, New York).
3.
RuppersbergH.DetempleI.Evaluation of the stress field in a ground steel plate from energy-dispersive X-ray diffraction experimentsMater. Sci. Engng, 1993, A161, 41–44.
4.
ShibanoJ.UkaiT.TadanoS.Measurement method of the stress distribution along a depth by polychromatic X-ray. In Proceedings of the Fourth International Conference onResidual Stresses, Baltimore, Maryland, 1994, pp. 207–213 (Society for Experimental Mechanics, Bethel, Connecticut).
5.
LavelleB.AlfonsoJ.A.LavelleC.AuchabieC.GreavesE. D.X-ray elastic constants determination using polychromatic and monochromatic radiation comparison on textured nickel sample. In Proceedings of the Fourth European Conference on Residual Stresses (Eds DenisS. J.LebrunL. B.Bourniquel BarralM.FlauenotJ. F.), Cluny, France, 1996, pp. 310–315 (Société Française de Métallurgie et de Matériaux, Paris).
6.
CullityD.B.Elements of X-ray Diffraction, 2nd edition, 1978 (Addison-Wesley, Reading, Massachusetts).
7.
RuppersbergH.Complicated average stress-fields and attempts at their evaluation with X-ray diffraction methodsAdv. X-ray Analysis, 1994, 37, 235–244.
8.
ConvertF.MiegeB.J.The control of geometrical sources of error in X-ray diffraction applied to stress analysisJ. Appl. Crystallogr., 1992, 25, 384–390.
9.
GreavesE.D.BohusSajo-L.AlfonsoJ.A.Espectrometría de energía dispersiva para análisis cristalográfico y químico. In Seminario Regional sobre Aplicaciones Ambientales de los Isótopos y Radiaciones Para Países de América Latina y del Caribe, Santiago de Chile, 9–13 August 1993, pp. 9–17.
10.
DetempleI.RuppersbergH.Evaluation of σ33 from diffraction experiments performed with synchrotron radiation in the v and ø goniometricesAdv. X-ray Analysis, 1994, 37, 245–251.
11.
CaceciM.CacherisW.Fitting curves to dataByte, 1984, 9340–362.
12.
NoggleJ. H.Practical Curve Fitting and Data Analysis, 1993 (Ellis Horwood, Chichester, West Sussex) (PTR Prentice-Hall, Englewood Cliffs, New Jersey).
13.
EvansR. D.The Atomic Nucleus, 1955 (McGraw-Hill, New York).
