An experimental method used to measure the Young's modulus of the conductive thin film is proposed in this paper. This technology has utilized the electrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. The Young's modulus of conductive SnO2 thin film has been estimated by means of the formula and the thermal bend beam test presented.
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