Abstract
This review documents the application of electron backscatter diffraction (EBSD) in a scanning electron microscope to studies of grain boundaries. The EBSD technique is now applied routinely for the rapid measurement of crystallographic orientations, generally known as 'microtexture', in a variety of materials. Processing methodology and interpretation of EBSD data for interface studies require a different approach and different nomenclature to those for microtexture. After covering briefly the general principles of EBSD, this review therefore describes in detail EBSD data acquisition relevant to grain boundary characterisation, descriptions of interfaces, and both standard and advanced EBSD data processing. The approach taken is to highlight and explain the principles, issues, and pitfalls associated with the application of EBSD to grain boundaries. Finally, some suggestions are made for good practice in application of EBSD to grain boundaries.
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References
1.
Raabe
D.
Sachtleber
M.
Zhao
Z.
Roters
F.
Zaefferer
S.
: Acta Mater. , 2001 , 49 , 3433 –3441 .
2.
Fundenberger
J. J.
Morawiec
A.
Bouzy
E.
Lecomte
J. S.
: Mater. Chem. Phys . , 2003 , 81 , 535 –537 .
3.
Randle
V.
: `Microtexture determination and its applications', 1st edn; 1992, London, The Institute of Materials.
4.
Randle
V.
Engler
O.
: ‘Introduction to texture analysis: macrotexture, microtexture and orientation mapping’ ; 2000 , London , Taylor and Francis .
5.
Michael
J.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 75 -90 ; 2000 , New York , Kluwer Academic .
6.
Wilkinson
A. J.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 231 -246 ; 2000 , New York, Kluwer Academic.
7.
Humphreys
F. J.
: J. Mater. Set , 2001 , 36 , 3833 –3854 .
8.
Field
D. P.
Weiland
H.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 199 -210 ; 2000 , New York, Kluwer Academic.
9.
Black
M. P.
Higginson
R. L.
: Ser. Mater . , 1999 , 41 , 125 –129 .
10.
Randle
V.
: ‘Grain boundary geometry in polycrystals’ ; 1993 , Bristol , Institute of Physics Publishing .
11.
Randle
V.
: ‘The role of the coincidence site lattice in grain boundary engineering’ ; 1996 , London , The Institute of Materials .
12.
Randle
V.
Hoile
C.
: Mater. Sci. Forum , 1998 , 273-275 , 183 –190 .
13.
Randle
V.
: Acta Mater. , 1998 , 46 , 1459 –1480 .
14.
Lee
D. S.
Ryoo
H. S.
Hwang
S. K.
: Mater. Set Eng . , 2003 , A354 , 106 –111 .
15.
Shimada
M.
Kokawa
H.
Wang
Z. J.
Sato
Y. S.
Karibe
I.
: Acta Mater. , 2002 , 50 , 2331 –2341 .
16.
Alexandreanu
B.
Cape11
B.
Was
G. S.
Mater. Set Eng. , 2001, A300, 94-104.
17.
Kumar
M.
Schwartz
A. J.
King
W. E.
: Acta Mater. , 2002 , 50 , 2599 –2612 .
18.
Gourgues
A.-F.
: Mater. Sci. TechnoL , 2002 , 18 , 119 –133 .
19.
Schwarzer
R. A.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al.), 105 -122; 2000 , New York, Kluwer Academic.
20.
Dingley
D. J.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 1 -18 ; 2000 , New York, Kluwer Academic.
21.
Randle
V.
: `Microtexture determination and its applications', 2nd edn; 2003, London, Institute of Materials,.
22.
Humphreys
F. J.
Huang
Y.
Brough
I.
Harris
C.
: J. Microse . , 1999 , 195 , 212 –216 .
23.
El-Dasher
B. S.
Adams
B. L.
Rollett
A. D.
: Ser. Mater . , 2003 , 48 , 141 –145 .
24.
Terhune
S. D.
Swisher
D. L.
Oh-Ishi
K.
Horita
Z.
Langdon
T. G.
McNelley
T. R.
: Met. Mater. Trans . , 2002 , 33A , 2173 –2184 .
25.
Li
Z. J.
Liu
Q.
: Mater. Sci. Eng . , 2002 , A338 , 237 –242 .
26.
Dingley
D. J.
: J. Microse . , to be published .
27.
Wilson
A. W.
Madison
J. D.
Spanos
G.
: Ser. Mater . , 2001 , 45 , 1335 –1340 .
28.
Demirel
M. C.
El-Dasher
B. S.
Adams
B. L.
Rollett
A. D.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 65 -74 ; 2000 , New York , Kluwer Academic .
29.
Lange
F. F.
: Acta Metall. , 1967 , 15 , 311 –318 .
30.
Wolf
D.
: in ‘Materials interfaces: atomic-level structure and properties’, (ed.
Wolf
D.
Yip
S.
, 1 -52;1992, London, Chapman & Hall.
31.
Saylor
D. M.
Morawiec
A.
Cherry
K. W.
Rogan
F. H.
Rohrer
G. S.
Mahadevan
S.
Casasent
D.
: Mater. Sci. Forum , 2002 , 408-412 , 1705 –1710 .
32.
Bruckner
C.
Pospiech
J.
Seidl
I.
Gottstein
G.
: Ser. Mater . , 2001 , 44 , 2635 –2640 .
33.
Loloee
R.
Pratt
W. P.
Crimp
M. A.
: Philos. Mag . , 2001 , 81A , 261 –273 .
34.
Brandon
D. G.
: Acta Mater. , 1966 , 14 , 1479 –1484 .
35.
Frank
F. C.
: Metall. Trans . , 1988 , 19A , 403 –409 .
36.
Field
D. P.
Sanchez
J. E.
, Jr, P. R. Besser and D. J. Dingley : J. AppL Phys . , 1997 , 82 , 2383 –2392 .
37.
Caleyo
F.
Baudin
T.
Penelle
R.
Venegas
V.
: Mater. Set Eng . , 2001 , A298 , 227 –234 .
38.
Randle
V.
: Proc. R Soc. , 1990, 431A, 61-69.
39.
Randle
V.
Day
A.
: Mater. Set TechnoL , 1993 , 9 , 1069 –1078 .
40.
Rajan
K.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 39 -50 ; 2000 , New York, Kluwer Academic .
41.
Samajdar
I.
Ratchev
P.
Verlinden
B.
Aernoudt
E.
: Acta Mater. , 2001 , 49 , 1759 –1769 .
42.
Wu
G. L.
Godfrey
A.
Liu
W.
Liu
Q.
: Ser. Mater . , 2001 , 45 , 1117 –1122 .
43.
Randle
V.
Davies
H. M.
Cross
I.
: Curr. Opin. Mater. Set , 2001 , 5 , 3 –8 .
44.
Perez-Prado
M. T.
McNelley
T. R.
: Ser. Mater . , 1999 , 40 , 1401 –1406 .
45.
Chu
J. P.
Wu
J. H.
Yasuda
H. Y.
Umakoshi
Y.
Inoue
K.
: Intermetallics , 2000 , 8 , 39 –46 .
46.
Mackenzie
J. K.
: Biometrika , 1958 , 45 , 229 –236 .
47.
Barnett
M. R.
Montheillet
F.
: Acta Mater. , 2002 , 50 , 2285 –2296 .
48.
Huang
Y.
Humphreys
F. J.
: Acta Mater. , 1999 ,47 , 2259 –2268 .
49.
Gertsman
V. Y.
Bruemmer
S. M.
: Acta Mater. , 2001 ,49 , 1589 –1598 .
50.
Hutchinson
W. B.
Ryde
L.
Bate
P. S.
Bacroix
B.
: Ser. Mater . , 1996 , 35 , 579 –582 .
51.
Tatschl
A.
Kolednik
O.
: Mater. Set Eng . , 2003 , 342A , 152 –168 .
52.
Palumbo
G.
Aust
K. T.
: in ‘Materials interfaces: atomic-level structure and properties’, (ed.
Wolf
D.
Yip
S.
, 190 -205;1992, London , Chapman & Hall.
53.
Randle
V.
Davies
H.
: Metall. Mater. Trans . , 2002 , 33A , 1853 –1857 .
54.
Davies
H. M.
Randle
V.
: Philos. Mag. A , 2001 , 81 , 2553 –2564 .
55.
King
W. E.
Schwartz
A. J.
: Ser. Mater . , 1998 , 38 , 449 –455 .
56.
Randle
V.
: Acta Mater. , 1999 , 47 , 4187 –4196 .
57.
Kumar
M.
King
W. E.
Schwartz
A. J.
: Acta Mater. , 2000 , 48 , 2081 –2091 .
58.
Bystrzycki
J.
Varin
R. A.
Nowell
M.
Kurzydlowski
K. J.
: Intermetallics , 2000 , 8 , 1049 –1059 .
59.
Randle
V.
: Interface Sci. , 2002 , 10 , 271 –277 .
60.
Bouyne
E.
Flower
H. M.
Lindley
T. C.
Pineau
A.
: Ser. Mater . , 1998 , 39 , 295 –300 .
61.
Gourgues
A.-F.
Flower
H. M.
Lindley
T. C.
: Mater. Set TechnoL , 2000 , 16 , 26 –40 .
62.
Field
D. P.
Weiland
H.
Kunze
K.
: Can. Metall. Q . , 1995 , 34 , 203 –210 .
63.
Davies
P.
Randle
V.
: Mater. Sci. Technot , 2001 , 17 , 615 –626 .
64.
Alexandreanu
B.
Was
G. S.
: Philos. Mag. A , 2001 , 81A , 1951 –1965 .
65.
Owusu-Boahen
K.
King
A. H.
: Ser. Mater . , 2000 , 42 , 301 –306 .
66.
Prior
D. J.
: J. Microse . , 1999 , 195 , 217 –225 .
67.
Wilkinson
A. J.
: Ser. Mater . 2001 , 44 , 2379 –2385 .
68.
Davies
R. K.
Randle
V.
: Mater. Sei. Eng . , 2000 , A283 , 251 –265 .
69.
Semoroz
A.
Durandet
Y.
Rappaz
M.
: Acta Mater. , 2001 , 49 , 529 –541 .
70.
Randle
V.
: J. Microse . , 1999 , 195 , 226 –232 .
71.
Randle
V.
Davies
H.
: Ultramicroscopy , 2002 , 90 , 153 –162 .
72.
Leach
C.
: Int. J. Inorg. Mater . , 2001 ,3 , 1117 –1119 .
73.
Randle
V.
: Mater. Charact . , 1995 , 34 , 29 –34 .
74.
Pan
Y.
Adams
B. L.
Olson
T.
Panayotou
N.
: Acta Mater. , 1996 , 44 , 4685 –4695 .
75.
Randle
V.
: Ser. Mater . , 2001 , 44 , 2789 –2794 .
76.
Wright
S. I.
Larsen
R. J.
: J. Microse . , 2002 , 205 245 –252 .
77.
Pan
Y.
Olson
T.
Adams
B. L.
: Can. Metall Q . , 1995 , 34 , 147 .
78.
King
W. E.
Stölken
J. S.
Kumar
M.
Schwartz
A. J.
: in ‘Electron backscatter diffraction in materials science’, (ed.
Schwartz
A. J.
et al), 153 -170 ; 2000 , New York, Kluwer Academic.
79.
Minich
R. W.
Schuh
C. A.
Kumar
M.
: Phys. Rev. , 2002, 66b, paper 052101.
80.
Wall
M. A.
Schwartz
A. J.
Nguyen
L.
: Ultramicroscopy , 2001 , 88 , 73 –83 .
81.
Wu
G. T.
Adams
B. L.
Bauer
C. L.
Casasent
D.
Morawiec
A.
Ozdemir
S.
Talukder
A.
: Ultramicroscopy , 2002 , 93 , 99 –109 .
82.
Schuh
C. A.
Kumar
M.
King
W. E.
: Acta Mater. , 2003 , 51 , 687 –700 .
83.
Koblischka
M. R.
Koblischka-Veneva
A.
: Physica C: Superconductivity , 2003 , 392-396 , 545 –556 .
84.
Yokomizo
T.
Enomoto
M.
Umezawa
O.
Spanos
G.
Rosenberg
R. O.
Mater. Sei. Eng . , 2003 , 344A , 261 –267 .