Abstract
Methods of identifying poor test-related motivation using the Wechsler Adult Intelligence Scale Digit Span subtest are based on identification of performance patterns that are implausible if the test taker is investing full effort. No studies to date, however, have examined the specificity of such measures, particularly when evaluating persons with either known or suspected learning or attention disorders. This study investigated performance of academically challenged students on three measures embedded in the Wechsler Adult Intelligence Scale—III, namely, low Digit Span, high Vocabulary-Digit span (Voc-DS), and low Reliable Digit Span scores. Evaluating subjects believed to be investing full effort in testing, it was found that both Digit Span and Reliable Digit Span had high specificity, although both showed relatively lower sensitivity. In contrast, VOC-DS was especially weak in both sensitivity and specificity, with an apparent false positive rate of 28%. Use of VOC-DS is therefore not appropriate for those with a history of learning or attention problems.
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