Methodological Aspects of the High-energy Synchrotron X-ray Diffraction Technique for Internal Stress Evaluation

Abstract

The availability of high-energy X-rays from 3rd-generation synchrotron sources offers new approaches to study internal stresses in the bulk of crystalline materials. A method with a wide application potential is the transmission technique introduced by Daymond and Withers, which however has so far been limited to fine-grained materials. In the present work, the reasons for the currently existing limitations are discussed and a viable strategy to extend the technique to samples with coarser grain sizes is proposed.