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Research article

First published 1978-5

Measurement of Electronic and Resonance Raman Spectra from the Same Gas Matrix or Thin Film Sample

W. Scheuermann, K. Nakamoto

Applied Spectroscopy

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Research article

First published 2006-11

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

C. Trager-Cowan, F. Sweeney, A. Winkelmann [...]

Materials Science and Technology

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Research article

First published 2015-9

Stress effects on electronic properties of GaAs thin film

Jin-Long Tang, Yuan Hu, Cai Wen [...]

Proceedings of the Institution of Mechanical Engineers,Part N: Journal of Nanomaterials,Nanoengineering and Nanosystems

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Research article

First published 2011-6

Comparison of microstructure and electronic properties of TiO 2 thin films grown by different techniques

A K Prasad, R Jha, R Ramaseshan [...]

Surface Engineering

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Research article

First published 2002-06

Noncontact Electron Gun Actuation of a Piezoelectric Polymer Thin Film Bimorph Structure

Jeffrey W. Martin, John A. Main

Journal of Intelligent Material Systems and Structures

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Research article

First published 1994-6

Spectroscopic Properties of WO 3 Thin Films: Polarized FT-IR/ATR,X-Ray Diffraction,and Electronic Absorption

Todd A. Taylor, Howard H. Patterson

Applied Spectroscopy

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Research article

First published 2010-11

Effect of sputtering pressure and temperature on DC magnetron sputtered CrN films

H. N. Shah, R. Jayaganthan, D. Kaur

Surface Engineering

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Research article

First published 2016-11

Preferentially oriented electron beam deposited TiN thin films using focused jet of nitrogen gas

R. Ramaseshan, Feby Jose, S. Rajagopalan [...]

Surface Engineering

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Research article

First published 2005-8

Particle induced X-ray emission spectroscopic (PIXE) and surface morphological (AFM) studies on electron beam evaporated WO 3 thin films

R. Sivakumar, V. Ganesan, V. Vijayan [...]

Surface Engineering

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Research article

First published 2011-1

Infrared Monitoring of Diamond Metalization

Robert Lovrinčić, Sebastian Noebel, Annemarie Pucci

Applied Spectroscopy

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