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Research article

First published 2022-3

Varied layer thickness improves structural properties of YSZ thin film

Nur Fathirah Mohd Rahimi, Sathiabama T. Thirugnana, Sib Krishna Ghoshal [...]

Proceedings of the Institution of Mechanical Engineers,Part N: Journal of Nanomaterials,Nanoengineering and Nanosystems

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Research article

First published 2012-9

Using anisotropic dielectrics to improve frequency selective surfaces response

Antonio Luiz Pereira de Siqueira Campos

International Journal of Applied Electromagnetics and Mechanics

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Research article

First published 2011-7

Machining processes for sapphire wafers: a literature review

Z C Li, Z J Pei, P D Funkenbusch

Proceedings of the Institution of Mechanical Engineers,Part B: Journal of Engineering Manufacture

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Research article

First published 2011-12

Simultaneous Surface-Enhanced Raman Spectroscopy (SERS) and Atomic Force Microscopy (AFM) for Label-Free Physicochemical Analysis of Lipid Bilayers

Claire S. Sweetenham, Marta Larraona-Puy, Ioan Notingher

Applied Spectroscopy

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Research article

First published 2003-6

Closed Loop Controlled Ba x Sr 1–x Tio 3 Thin Films In Spray Flames

B. Vukasinovic, S. Sundell, M. Oljaca

Surface Engineering

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Research article

First published 2005-6

Pulsed laser deposition of novel oxide materials

P. Kuppusami, S. N. Padhi, K. Muthukkumaran [...]

Surface Engineering

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Review article

First published 2003-3

Thallium based high temperature superconductors for microwave device applications

S. C. Speller

Materials Science and Technology

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Research article

First published 1997-1

Hydrogen free tetrahedral carbon film preparation and tribological characterisation

B. K. Tay, X. Shi, D. I. Flynn [...]

Surface Engineering

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Research article

First published 1998-7

Advanced in situ Sapphire Test Cell for Raman Spectroscopy within Aqueous Environments

David M. Carey, Eric P. Plesko, John O. Outwater

Applied Spectroscopy

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Research article

First published 2025

Effects of sintering temperature variation on structure,morphology and electrical characteristics of YSZ thin film

Nur Fathirah Mohd Rahimi, Sathiabama T. Thirugnana, Sib Krishna Ghoshal

Proceedings of the Institution of Mechanical Engineers,Part N: Journal of Nanomaterials,Nanoengineering and Nanosystems

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