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Research article

First published 2001-12

Confocal Raman Depth Profiling of Surface-Modified Polymer Films: Effects of Sample Refractive Index

Helmut Reinecke, Stephen J. Spells, Javier Sacristán [...]

Applied Spectroscopy

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Research article

First published 1987-7

Near-Surface Analysis and Depth Profiling by FT-IR Photoacoustic Spectroscopy

Charles Q. Yang, Randall R. Bresee, William G. Fateley

Applied Spectroscopy

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Research article

First published 2009-2

Prediction of hardness–depth profile from indentations at surface of materials

J. Lesage, D. Chicot, L. Nosei [...]

Surface Engineering

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Research article

First published 1993-7

Novel Approach to Quantitative Depth Profiling of Surfaces Using ATR/FT-IR Measurements

Jiangbing Huang, Marek W. Urban

Applied Spectroscopy

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Research article

First published 2001

Evaluation of Road Surface Profiler and Transverse Profilograph for Determination of Rut Depths

Yusuf Mehta, Reynaldo Roque, George Lopp [...]

Transportation Research Record: Journal of the Transportation Research Board

Free access

Research article

First published 2015-10

Experimental investigations into machining accuracy and surface roughness of microgrooves fabricated by electrochemical micromachining

V Rathod, B Doloi, B Bhattacharyya

Proceedings of the Institution of Mechanical Engineers,Part B: Journal of Engineering Manufacture

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Research article

First published 2009-2

Surface Treatment Analyses of Car Bearings by Using Laser-Induced Breakdown Spectroscopy

F. C. Alvira, D. J. O. Orzi, G. M. Bilmes

Applied Spectroscopy

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Research article

First published 2002-9

Raman Spectroscopic Analysis of Paper Coatings

Pei He, Shivashanker Bitla, Doug Bousfield [...]

Applied Spectroscopy

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Research article

First published 2024-8

Measuring the Macrotexture of Pavement Surface Using an Image Processing Technique

Nabanita Roy, Anil Kumar Baditha, Soumyarup Biswas [...]

Transportation Research Record: Journal of the Transportation Research Board

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Research article

First published 2003-12

Spectral Depth Profiling of Arbitrary Surfaces by Thermal Emission Decay—Fourier Transform Infrared Spectroscopy

Ioan Notingher, Robert E. Imhof, Peng Xiao [...]

Applied Spectroscopy

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