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Research article

First published 1995-9

Observations on the Measurement of Vibrational Circular Dichroism with Rapid-Scan and Step-Scan FT-IR Techniques

Baoliang Wang, Timothy A. Keiderling

Applied Spectroscopy

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Research article

First published 1997-4

Time- and Energy-Resolved Emission Spectroscopy Using a Step-Scan FT Spectrometer Combined with Correlational Analysis Techniques

K. Thonke, T. Baier, J. Hamann [...]

Applied Spectroscopy

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Research article

First published 1999-12

Dynamic Infrared Spectroscopy Using the Rapid-Scan Technique

Sanong Ekgasit, Heinz W. Siesler, Paul A. M. Steeman

Applied Spectroscopy

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Research article

First published 1991-1

Application of Step-Scan Interferometry to Two-Dimensional Fourier Transform Infrared (2D FT-IR) Correlation Spectroscopy

Richard A. Palmer, Christopher J. Manning, James L. Chao [...]

Applied Spectroscopy

Open access

Research article

First published 2021

RETRACTED: Comparison of adhesive bond strength among fiber reinforced post and core with different cementation techniques: In vitro study

Abdulaziz AlHelal, Khalid AlShehri, Abdullah AlOmairy [...]

Journal of Applied Biomaterials & Functional Materials

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Research article

First published 1993-9

Investigation of Time-Dependent Phenomena by Use of Step-Scan FT-IR

Richard A. Palmer, James L. Chao, Rebecca M. Dittmar [...]

Applied Spectroscopy

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Research article

First published 2005-1

Effects of Swept Scanning on Velocity Estimation

Geng-Shi Jeng, Pai-Chi Li

Ultrasonic Imaging

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Research article

First published 1993-9

Applications of Time-Resolved Step-Scan and Rapid-Scan FT-IR Spectroscopy: Dynamics from Ten Seconds to Ten Nanoseconds

T. J. Johnson, A. Simon, J. M. Weil [...]

Applied Spectroscopy

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Research article

First published 1992-1

Polarization-Modulation Emission FT-IR Measurement of Thin Organic Films on Metal Surfaces

Kenji Tochigi, Hideto Momose, Yutaka Misawa [...]

Applied Spectroscopy

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Research article

First published 1979-01

A simple method for correcting time constant errors incurred in step scan systems

I.R. Fothergill, W.E.J. Neal

Transactions of the Institute of Measurement and Control

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