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Articles (479)

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1-10 of 479 results for IR-microscopy

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Select article: Photothermal FT-IR Spectroscopy: A Step towards FT-IR Microscopy at a Resolution Better Than the Diffraction Limit

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Research article

First published 1999-7

Photothermal FT-IR Spectroscopy: A Step towards FT-IR Microscopy at a Resolution Better Than the Diffraction Limit

A. Hammiche, H. M. Pollock, M. Reading [...]

Applied Spectroscopy

Select article: Screening of Gunshot Residue in Skin Using Attenuated Total Reflection Fourier Transform Infrared (ATR FT-IR) Hyperspectral Microscopy

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Research article

First published 2020-4

Screening of Gunshot Residue in Skin Using Attenuated Total Reflection Fourier Transform Infrared (ATR FT-IR) Hyperspectral Microscopy

Ángela Álvarez, Jorge Yáñez

Applied Spectroscopy

Select article: AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization

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Research article

First published 2012-12

AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization

Alexandre Dazzi, Craig B. Prater, Qichi Hu [...]

Applied Spectroscopy

Select article: A Low-Cost Reflectance FT-IR Microscope

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Research article

First published 1991-8

A Low-Cost Reflectance FT-IR Microscope

J. A. J. Jansen, J. H. Van Der Maas, A. Posthuma De Boer

Applied Spectroscopy

Select article: Spatial Differentiation of Sub-Micrometer Domains in a Poly(Hydroxyalkanoate) Copolymer Using Instrumentation That Combines Atomic Force Microscopy (AFM) and Infrared (IR) Spectroscopy

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Research article

First published 2011-10

Spatial Differentiation of Sub-Micrometer Domains in a Poly(Hydroxyalkanoate) Copolymer Using Instrumentation That Combines Atomic Force Microscopy (AFM) and Infrared (IR) Spectroscopy

Curtis Marcott, Michael Lo, Kevin Kjoller [...]

Applied Spectroscopy

Select article: Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

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Research article

First published 2018-6

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Karsten Hinrichs, Timur Shaykhutdinov

Applied Spectroscopy

Select article: IR Microscopy Applied to Slider Rail Depletion of Lube on a Thin-Film Magnetic Recording Disk

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Research article

First published 1990-9

IR Microscopy Applied to Slider Rail Depletion of Lube on a Thin-Film Magnetic Recording Disk

C. J. Mastrangelo, L. Von Schell, Y. Le

Applied Spectroscopy

Select article: Novel Method for High-Spatial-Resolution Chemical Analysis of Buried Polymer-Metal Interface: Atomic Force Microscopy-Infrared (AFM-IR) Spectroscopy with Low-Angle Microtomy

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Research article

First published 2021-7

Novel Method for High-Spatial-Resolution Chemical Analysis of Buried Polymer-Metal Interface: Atomic Force Microscopy-Infrared (AFM-IR) Spectroscopy with Low-Angle Microtomy

Naoki Baden

Applied Spectroscopy

Select article: ATR/FT-IR and Raman Microscopic Investigation of Diffusion and Distribution of Silane Coupling Agents in PVC Films

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Research article

First published 2000-4

ATR/FT-IR and Raman Microscopic Investigation of Diffusion and Distribution of Silane Coupling Agents in PVC Films

Peter Eaton, Paul Holmes, Jack Yarwood

Applied Spectroscopy

Select article: Early and Rapid Detection of Potato's Fungal Infection by Fourier Transform Infrared Microscopy

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Research article

First published 2007-10

Early and Rapid Detection of Potato's Fungal Infection by Fourier Transform Infrared Microscopy

Vitaly Erukhimovitch, Leah Tsror (LAHKIM), Marina Hazanovsky [...]

Applied Spectroscopy

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