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Articles (9)

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1-9 of 9 results for Echelle gratings

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Select article: Spectral Efficiency of the SpectraSpan III Echelle Grating Spectrometer

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Research article

First published 1985-1

Spectral Efficiency of the SpectraSpan III Echelle Grating Spectrometer

Andrew T. Zander, Myron H. Miller, Martha S. Hendrick [...]

Applied Spectroscopy

Select article: Examination of the Spectral Efficiency of an Echelle Grating Monochromator

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Research article

First published 1979-9

Examination of the Spectral Efficiency of an Echelle Grating Monochromator

Andrew T. Zander, Peter N. Keliher

Applied Spectroscopy

Select article: Development of precision blank carriage for manufacturing large gratings and echelles

Open access

Research article

First published 2019-1

Development of precision blank carriage for manufacturing large gratings and echelles

Xinfang Ge, Biao Chu

Advances in Mechanical Engineering

Select article: Structural property investigation on obliquely deposited thick Al films

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Research article

First published 2016-3

Structural property investigation on obliquely deposited thick Al films

Z. Z. Li, J. S. Gao, H. G. Yang [...]

Surface Engineering

Select article: Spectral Characteristics of a New Spectrometer Design for Atomic Emission Spectroscopy

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Research article

First published 1986-8

Spectral Characteristics of a New Spectrometer Design for Atomic Emission Spectroscopy

V. Karanassios, G. Horlick

Applied Spectroscopy

Select article: Multivariate Calibration of a Photodiode Array Spectrometer for Atomic Emission Spectroscopy

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Research article

First published 1991-3

Multivariate Calibration of a Photodiode Array Spectrometer for Atomic Emission Spectroscopy

Mark Glick, Kevin R. Brushwyler, Gary M. Hieftje

Applied Spectroscopy

Select article: Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

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Research article

First published 1995-10

Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

Luc Soudier, Jean-Michel Mermet

Applied Spectroscopy

Select article: High-Throughput,High-Resolution Echelle Deep-UV Raman Spectrometer

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Research article

First published 2013-8

High-Throughput,High-Resolution Echelle Deep-UV Raman Spectrometer

Sergei V. Bykov, Bhavya Sharma, Sanford A. Asher

Applied Spectroscopy

Select article: Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part II: Applications to Qualitative Analysis with Line-Rich Matrices

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Research article

First published 1996-8

Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part II: Applications to Qualitative Analysis with Line-Rich Matrices

Cedric Rivier, Jean-Michel Mermet

Applied Spectroscopy

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