Subnanosecond In-Line Soft X-Ray Holography Using Germanium Laser in the 20 nm Wavelength Region

Abstract

Near- and far-field characteristics of a germanium soft x-ray laser at the wavelengths of 23.2–23.6 nm (J = 2-1 transitions) and 19.6 nm (J = 0-1 transition) are given for quantitative evaluation of the germanium laser for holographic applications. In-line Gabor holography of simple structured objects, such as thin opaque fibers and a standard electron microscope test specimen, is demonstrated. The holograms were recorded on PMMA (polymethyl methacrylate) photoresists and llford Q-plates. The holograms recorded on PMMA were retrieved with an atomic force microscope. The object image was reconstructed by numerical reconstruction with phase retrieval algorithm, resulting in a clear, ghost-free image with sharp edges which infer sub-μm resolution. Future directions for x-ray laser holography are briefly discussed.