Abstract
The advantages of the use of x-ray microtomography in materials science are discussed, and illustrated by the nondestructive study of the mechanical damage in a continuous fiber SiC/Al composite at a resolution of about 25 μm. A laboratory x-ray source was used, and it was shown that quantitative measurements of the linear absorption coefficient at this resolution are possible, even though the AgKα radiation used is accompanied by a considerable amount of white radiation, provided that the counter system is properly corrected for pulse pile up and dead-time.
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