Abstract
Detection of internal flaws in conducting materials with considerable thickness is difficult using eddy current tests. This paper presents an alternative method, which uses dc magnetic field excited by the current impressed across the conducting material. In this case the internal flaws give rise perturbations of current flow and consequently the magnetic field is also changed. Perturbations in the magnetic field can be detected by dc (direct current) sensors such as magnetoresistive or Fluxset sensors. In this work numerically performed experiments are presented to recover flaws at the interfaces of metal parts jointed at high temperature by high intensity pressure.
Get full access to this article
View all access options for this article.