Vapor-deposited Ag and Au films exhibit high surface-enhanced Raman scattering (SERS) sensitivity. With thin metal films, SERS spectra can be obtained by using a “backside” configuration in which the laser light is focused through the substrate onto the metal film/liquid (or gas) interface. Use of the “backside” configuration is particularly advantageous for obtaining SERS spectra of aqueous samples. Because excitation occurs only at the metal/film/liquid interface, both attenuation of the signal by water and fluorescence interference are minimized. However, noble metals, such as Ag and Au, do not adhere well to glass substrates, and significant exposure to water damages the films. In this paper, three methods of adhering Au to glass and their effect on the SERS response are examined. The methods include the use of a buffer metal between the SERS-active metal film and the glass substrate; the use of (3-mercaptopropyl)trimethoxysilane (MCTMS); and the use of organometallic paints. Of the methods examined, the best film adherence and SERS response was obtained by using MCTMS to bind the metal film to a chemically etched glass slide.
FleischmannM.HendraP. J. and McQuillanA. J, Chem. Phys. Lett.26, 163 (1974).
2.
JeanmaireD. L. and Van DuyneR. P, J. Electroanal. Chem.84, 1 (1977).
3.
PhilbottM. R., J. Chem. Phys.62, 1812 (1975).
4.
GarrellR. L., Anal. Chem.61, 401A (1989).
5.
GaoP.PattersonM. L.TadayyoniM. A. and WeaverM, Langmuir1, 173 (1985).
6.
StoreyJ. M.BarberT. E.SheltonR. D.WachterE. A.CarronK. T. and JiangY, Spectroscopy10, 20 (1995).
7.
Vo-DinhT.HiromotoM. Y. K.BegunG. M. and MoodyR. L, Anal. Chem.56, 1667 (1984).
8.
RothE. and KieferW, Appl. Spectrosc.48, 1193 (1994).
9.
CarronK. T. and KennedyB. J, Anal. Chem.67, 3353 (1995).
10.
FreemanR. D.HammakerR. M.MeloanC. E. and FateleyW. G, Appl. Spectrosc.42, 456 (1988).
11.
SéquarisJ.-M. L. and KoglinE, Anal. Chem.59, 527 (1987).
12.
CarrabbaM. M.EdmondsR. B.RauhR. D.HaasJ.III, in Proceedings of the Second International Symposium on Field Screening Methods for Hazardous Wastes and Toxic Chemicals, Las Vegas, Nevada (1991), p. 67.
13.
StoreyJ. M. E.SheltonR. D.BarberT. E. and WachterE. A, Appl. Spectrosc.48, 1265 (1994).
14.
CarronK.PietersenL. and LewisM, Environ. Sci. Technol.26, 1950 (1992).
15.
MullenK. and CarronK, Anal. Chem.66, 478 (1994).
16.
WachterE. A.StoreyJ. M. E.SharpS. L.CarronK. T. and JiangY, Appl. Spectrosc.49, 193 (1995).
17.
NorrodK. L.SudnikL. M.RousellD. and RowlenK. L, Appl. Spectrosc.51, 994 (1997).
18.
JanataJ., Principles of Chemical Sensors (Plenum Press, New York, New York, 1989).
19.
GrabarK. C.AllisonK. J.BakerB. E.BrightR. M.BrownK. R.FreemanR. GriffithFoxA. P.KeatingC. D.MusickM. D. and NatanM. J, Langmuir12, 2353 (1996).
20.
LeungL.-W. H.GostolaD. and WeaverM. J, Langmuir3, 45 (1987).
21.
CarrabbaM. M.EdmondsR. B.SpencerK. M. and RaihR. D, “Fiber Optic Raman Chemical Sensors”, Chemical Sensors II, ButlerM.RiccoA. and YamazoeN, Eds. (The Electrochemical Society, Pennington, New Jersey1993), p. 634.
22.
SwalenJ. D.AllaraA. L.AndradeJ. D.ChandrossE. A.GaroffS.IsraelachviliJ.McCarthyT. J.MurrayR.PeaseR. F.RaboltJ. F.WynneK. J. and YuH, Langmuir3, 832 (1987).
23.
JooT. H.KimM. S. and KimK. J, J. Raman Spectrosc.18, 57 (1987).
24.
CarronK. Y. and HurleyL. G, J. Phys. Chem.95, 9979 (1991).
25.
BelloJ. M. and Vo–DinhT, Appl. Spectrosc.44, 63 (1990).
26.
MullenK. I. and CarronK. T, Anal. Chem.63, 2196 (1991).
27.
UdagawaM.ChouC.-C.HemmingerJ. C. and UshiodaS, Phys. Rev. B23, 6843 (1981).
28.
BillmannJ.KovacsG. and OttoA, Surf. Sci.92, 153 (1980).
29.
MurrayC. A. and AllaraD. L, J. Chem. Phys.76, 1290 (1982).
30.
AdrianF. J., J. Chem. Phys.77, 5302 (1982).
31.
ChaseB. and ParkinsonB, J. Phys. Chem.95, 7810 (1991).
32.
AravindP. K.NitzanA. and MetuiH, Surf. Sci.110, 189 (1981).
33.
CarronK. T., private communication.
34.
GerstenJ. and NitzanA, J. Chem. Phys.73, 3023 (1980).
35.
Vo-DinhT.MeierM. and WokaumA, Anal. Chim. Acta181, 139 (1986).
36.
YeQ.FangJ. and SunL, J. Phys. Chem. B101, 8221 (1997).
37.
TsenM. and SunL, Anal. Chim. Acta307, 333 (1995).
38.
LaceyW. B.WilliamsJ. M.WenzlerL. A.BeebeT. P.Jr., and HarrisJ. M., Anal. Chem.68, 1003 (1996).
DawsonP.HaasJ. W.IIIAlexanderK. B.ThompsonJ. and FerrillT. L, Surf. Sci.250, L383 (1991).
45.
ThunR. E., “Structures of Thin Films”, in Physics of Thin Films, Vol. 1, HaasG., Ed. (Academic Press, New York, New York, 1963).
46.
NeugebauerC. A., “Structural Disorder Phenomena in Thin Metal Films”, in Physics of Thin Films, Vol. 2, HaasG. and ThunR. E, Eds. (Academic Press, New York, New York, 1964).
47.
ThunR. E., “Structure of Thin Films”, in Physics of Thin Films, Vol. 1, HaasG., Ed. (Academic Press, New York, New York, 1963).
48.
StowellM. J., “Surface Processes in Thin-Film Growth”, in Molecular Processes on Solid Surfaces, DrauglisE.GretzR. D. and JaffeeR. I, Eds. (McGraw–Hill, New York, New York, 1969).
49.
GossC. A.CharychD. H. and MajdaM, Anal. Chem.63, 85 (1991).
50.
GrabarK. C.FreemanR. G.HommerM. B. and NatanM. J, Anal. Chem.67, 735 (1995).
51.
AdrianF. J., Chem. Phys. Lett.78, 45 (1981).
52.
AlakA. M. and Vo–DinhT, Anal. Chem.61, 656 (1989).
53.
Van DuyneR. P.HulteenJ. C. and TreichelD. A, J. Chem. Phys.99, 2101 (1993).
54.
RoweJ. E.ShankC. V.ZwemerD. A. and MurrayC. A, Phys. Rev. Lett.44, 1770 (1980).
55.
BirkeR. L.LuT. and LombardiJ. R, “Surface-Enhanced Raman Spectroscopy”, in Techniques for Characterization of Electrodes and Electrochemical Processes, VarmaR. and SelmanJ. R, Eds. (John Wiley and Sons, New York, New York, 1991).
