YingJ. F. and DouglasD. J, “High Resolution ICP Mass Spectra with a Quadrupole Mass Filter”, Rapid Comm. Mass Spectrom., in press (1996).
8.
WarrenA. R.AllenL. A.PangH.HoukR. S. and JanghorbaniM, Appl. Spectrosc.48, 1360 (1994).
9.
LloydA. A.PangH. M.WarrenA. R. and HoukR. S, J. Anal. At. Spectrom.10, 267 (1995).
10.
MoensL.VanhaeckeF.RiondatoJ. and DamsR, J. Anal. At. Spectrom.10, 569 (1995).
11.
VanhaeckeF.MoensL.DamsR. and TaylorP, Anal. Chem.68, 567 (1996).
12.
WalderA. J. and FreedmanP. A, J. Anal. At. Spectrom.7, 571 (1992).
13.
HallidayA. N.LeeD.ChristensenJ. N.WalderA. J.FreedmanP. A.JonesC. E.HallC. M.YiW. and TeagleD, Int. J. Mass Spectrom. Ion Process.146/147, 21 (1995).
14.
BurgoyneT. W.HieftjeG. M. and HitesR. A, “The Design and Characteristics of a Plasma Source Mass Spectrograph”, J. Am. Soc. Mass Spectrom. (1996), paper in press.
15.
CromwellE. F. and ArrowsmithP, J. Am. Soc. Mass Spectrom.7, 458 (1996).
16.
KoppenaalD. W.BarinagaC. J. and SmithM. R, J. Anal. At. Spectrom.9, 1053 (1994).
17.
BarinagaC. J.EidenG. C. and KoppenaalD. W, in Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia (1995), p. 769.
18.
EidenG. C.BarinagaC. J. and KoppenaalD. W, J. Am. Soc. Mass Spectrom.7, 1161 (1996).
19.
EidenG. C.BarinagaC. J. and KoppenaalD. W, J. Anal. At. Spectrom.11, 317 (1996).
20.
McLuckeyS. A.GlishG. L.DuckworthD. C. and MarcusR. K, Anal. Chem.64, 1606 (1992).
21.
DuckworthD. C.SmithD. H.GoeringerD. E. and McLuckeyS. A, in Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia (1995), p. 41.
22.
ChambersD. M.GoeringerD. E.McLuckeyS. A. and GlishG. L, Anal. Chem.65, 14 (1993).
23.
GillC. G.DaigleB. and BladesM. W, Spectrochim. Acta46B, 1227 (1991).
24.
EidenG.BarinagaC. and KoppenaalD, “Selective Elimination of Argon Ions in an Inductively Coupled Plasma–Ion Trap Mass Spectrometer”, presented at the 44th ASMS Conference on Mass Spectrometry and Allied Topics, Portland, Oregon (1996), WPC 55.
25.
GoodnerK. L.MilgramK. E.WatsonC. H.EylerJ. R.DejsupaC. and BarshickC. M, J. Am. Soc. Mass Spectrom.7, 923 (1996).
26.
MarcusR. K.CableP. R.DuckworthD. C.BuchananM. V.PochkowskiJ. M. and WellerR. R, Appl. Spectrosc.46, 1327 (1992).
27.
MilgramE.WatsonC. and EylerJ, in Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia (1995), p. 1088.
28.
EylerJ. R.GoodnerK.MilgramE.CliffordW.DejsupaC. and BarshickC, “Recent Developments in Elemental Mass Analysis Using FTICR Mass Spectrometry”, presented at the 44th ASMS Conference on Mass Spectrometry and Allied Topics, Portland, Oregon (1996), MOB 9:50.
29.
DodonovA. F.ChernushevichI. V. and LaikoV. V, in Time-of-Flight Mass Spectrometry, CotterR. J., Ed. (American Chemical Society, Washington, D.C., 1994), p. 109.
30.
SinC. H.LeeE. D. and LeeM. L, Anal. Chem.63, 2897 (1991).
31.
BoyleJ. G. and WhitehouseC. M, Anal. Chem.64, 2084 (1992).
32.
VerentchikovA. N.EnsW. and StandingK. G, Anal. Chem.66, 126 (1994).
33.
MyersD. P.LiG.YangP. and HieftjeG. M, J. Am. Soc. Mass Spectrom.5, 1008 (1994).
34.
MyersD. P.LiG.MahoneyP. P. and HieftjeG. M, J. Am. Soc. Mass Spectrom.6, 400 (1995).
35.
MyersD. P.LiG.MahoneyP. P. and HieftjeG. M, J. Am. Soc. Mass Spectrom.6, 411 (1995).
36.
MyersD. P.HeintzM. J.MahoneyP. P.LiG. and HieftjeG. M, Appl. Spectrosc.48, 1337 (1994).
37.
HeintzM. J.MyersD. P.MahoneyP. P.LiG. and HieftjeG. M, Appl. Spectrosc.49, 945 (1995).
38.
HangW.YangP.WangX.YangC.SuY. and HuangB, Rapid Commun. Mass Spectrom.8, 590 (1994).
39.
SteinerR. E.LewisC. L. and KingF. L, in Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia (1995), p. 42.
40.
HarrisonW. W., “Atomic MS of Solids By Use of a Microsecond Pulse Discharge and a TOF Mass Analyzer”, presented at the 44th ASMS Conference on Mass Spectrometry and Allied Topics, Portland, Oregon (1996). MOB 09:30.
41.
MyersD. P.MahoneyP. P.LiG. and HieftjeG. M, J. Am. Soc. Mass Spectrom.6, 920 (1995).
42.
CotterR. J., Anal. Chem.64, 1027A (1992).
43.
BakkerJ. M. B., J. Phys. E: Sci. Instrum.6, 785 (1973).
44.
BakkerJ. M. B., J. Phys. E: Sci. Instrum.7, 364 (1974).
45.
MaC.MichaelS. M.ChienM.ZhuJ. and LubmanD. M, Rev. Sci. Instrum.63, 139 (1992).
46.
ColesJ. and GuilhausM, Trends Anal. Chem.12, 203 (1993).
47.
GulcicekE. E. and BoyleJ. G, Rev. Sci. Instrum.64, 2382 (1993).
48.
FulfordJ. E. and DouglasD. J, Appl. Spectrosc.40, 971 (1986).
49.
MichaelS. M.ChienB. M. and LubmanD. M, Anal. Chem.65, 2614 (1993).
50.
QianM. G. and LubmanD. M, Anal. Chem.67, 235A (1995).
51.
HuK.ClemonsP. S. and HoukR. S, J. Am. Soc. Mass Spectrom.4, 16 (1993).
52.
O'HalloranG. J. and WalkerL. W, Technical Document Report No. ASD TDR 62-644, Parts I and II, Nov. 1964 (Bendix Corporation, Research Laboratories Division, Southfield, Michigan).
53.
OpsalR. B.OwensK. G. and ReillyJ. P, Anal. Chem.57, 1884 (1985).
54.
WileyW. C. and McLarenI. H, Rev. Sci. Instrum.26, 1150 (1955).
55.
FloryC. A.TaberR. C. and YefchakG. E, Int. J. Mass Spectrom. Ion Processes152, 169 (1996).
56.
GardnerB. D.HollandJ. F. and ArtaevV. B, in Proceedings of the 42nd ASMS Conference on Mass Spectrometry and Allied Topics, Chicago, Illinois (1994), p. 1040.
57.
HulettJ.Jr.DonohueD. L. and LewisT. A, Rev. Sci. Instrum.62, 2131 (1991).
58.
WollnikH., Optics of Charged Particles (Academic Press, San Diego, 1987), pp. 48–88.
59.
LiG.MyersD. P. and HieftjeG. M, personal communication (1993).
60.
MamyrinB. A.KarataevD. V.SchmikkD. V. and ZagulinV. A, Sov. Phys. JETP37, 45 (1973).
61.
IoanoviciuD.YefchakG. E. and EnkeC. G, Int. J. Mass Spectrom. Ion Process.94, 281 (1989).
62.
GuilhausM., J. Mass Spectrom.30, 1519 (1995).
63.
MahoneyP. P.LiG.RayS. J. and HieftjeG. M, “Continuum Background Reduction in Time-of-Flight Mass Spectrometry with Continuous Ion Sources”, J. Am. Soc. Mass Spectrom. (1996), paper in press.
64.
HollandJ. F.NewcombeB.TecklenburgR. E.Jr.DavenportM.AllisonJ.WatsonJ. T. and EnkeC. G, Rev. Sci. Instrum.62, 69 (1991).
65.
MahoneyP. P.MyersD. P.LiG.HeintzM. J.YangP. and HieftjeG. M, “A Plasma Source Time-of-Flight Mass Spectrometer for Elemental Analysis: Analytical Characteristics”, presented at the 42nd ASMS Conference on Mass Spectrometry and Allied Topics, Chicago, Illinois (1994), Talk TOD 12:10.
66.
MahoneyP. P.LiG. and HieftjeG. M, J. Anal. At. Spectrom.11, 401 (1996).
67.
MahoneyP. P.RayS. J.LiG. and HieftjeG. M, “Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry with a Time-of-Flight Mass Analyzer”, Anal. Chem., submitted (1996).
68.
CareyJ. M. and CarusoJ. A, Crit. Rev. Anal. Chem.23, 397 (1992).
69.
GrayA. L., J. Anal. At. Spectrom.1, 247 (1986).
70.
SakataK. and KawabataK, Spectrochim. Acta48B, 1027 (1994).
71.
HieftjeG. M.LiG.MyersD. P.RayS. J. and MahoneyP. P, “A Second-Generation Inductively Coupled Plasma–Time-of-Flight Mass Spectrometer (ICP-TOFMS)”, presented at the 44th ASMS Conference on Mass Spectrometry and Allied Topics, Portland, Oregon (1996), Talk MOB 10;30.