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Abstract

Two-dimensional FT-IR spectroscopy has been used to study the N-H stretching and amide I/amide II region of melt-crystallized nylon 11 thin films on Teflon® substrates. Samples are dynamic mechanically oscillated at room temperature at a frequency of 11 Hz. A two-dimensional correlation analysis on the dynamic spectra indicates that the N-H stretching region splits into two peaks. Analysis of two-dimensional crossplots between the N-H stretching region and the amide I/amide II region shows that the prominent peak in the N-H stretching region (∼3300 cm⁻¹) is similar in morphological character to the ordered peak of the amide I region. The amide II region resolves into two-ordered and one-disordered peak.

Keywords

Dynamic two-dimensional FT-IR Step-scanning interferometry Nylon 11

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Dynamic Two-Dimensional Infrared Spectroscopy. Part I: Melt-Crystallized Nylon 11

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