Abstract
A new technique, total lifetime distribution analysis (TLDA), is described for rapid, sensitive, and accurate lifetime characterization of complex samples. Multiharmonic Fourier transform technology in a commercial, frequency-domain fluorescence lifetime instrument allows rapid acquisition of TLDA data. High sensitivity derives from the use of the entire fluorescence emission from the sample in the lifetime measurement. The maximum entropy method (MEM) provides a consistent basis for modeling of the lifetime data for accurate recovery of the total lifetime distribution of the sample. Because MEM is self-modeling, it is not subject to the same sources of bias that influence nonlinear least-squares fits of lifetime data to
Keywords
Get full access to this article
View all access options for this article.
