Abstract
A dual-beam FT-IR instrument with optical null has been developed for the study of polymers adsorbed on low-surface-area solids. By the use of narrow-bandpass filters coupled with the dual-beam FT-IR, a sensitivity of 2 × 10−5 absorption units per scan has been achieved. Transmission infrared spectra are shown for poly(ethylene oxide-b-styrene) and didodecyl dimethyl ammonium bromide (DODAB) adsorbed on silicon.
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