Abstract
A PX1 multilayer pseudocrystal is compared with a TlAP crystal for the analysis of light elements by means of two different excitation sources, i.e., a chromium and a scandium target tube. Peak and background intensities for Cl, S, P, Si, Al, Mg, Na, F, and O are compared with the use of both a fine and a coarse collimator. The most suitable working conditions for the analysis are pointed out.
Keywords
Get full access to this article
View all access options for this article.
References
1.
Grimaldi
R.
, “Analysis of O, N and C Using PX1 Crystal and Scandium Target Tube,” N. Italsider S.p.A. , private communication.
2.
le Sage
V.
and
Grubis
B.
, X-ray Spectrometry 2 , 189 (1973 ).
3.
Wybenga
F. T.
, X-ray Spectrometry 7 , 33 (1978 ).
4.
Bertin
E. P.
, Principles and Practice of X-ray Spectrometric Analysis (Plenum Press , New York , 1970 ), Chap. 4, p. 94 .
5.
Bertin
E. P.
, Principles and Practice of X-ray Spectrometric Analysis (Plenum Press , New York , 1970 ), Chap. 5, p. 120 .
6.
Jenkins
R.
and
de Vries
J. L.
, Practical X-ray Spectrometry (Philips Technical Library , Eindhoven , 1970 ), Chap. 5, p. 112 .
7.
Bent
H.
, Spectrochimica Acta 25B , 613 (1970 ).
8.
Bertin
E. P.
, Principles and Practice of X-ray Spectrometric Analysis (Plenum Press , New York , 1970 ), Appendix 6, p. 638 .
