A novel design of an accessory for diffuse reflectance spectroscopy in the infrared region is presented which allows in situ analysis of small surface areas (φ 3 mm) on bulky samples. The optical design and performance with particular respect to the rejection of specularly reflected radiation are discussed, and results for different varnishes are shown.
See, for example, GriffithsP. R. and FullerM. P., “Mid Infrared Spectrometry of Powdered Samples,” in Advances in Infrared and Raman Spectroscopy, ClarkR. J. H. and HesterR. E., Eds. (Wiley-Interscience, New York, 1982), Vol. 9, pp. 63–129.
2.
ChalmersJ. M. and MackenzieM. W., Appl. Spectrosc.39, 634 (1985).
3.
ChaseD. B.AmeyR. L., and HoltjeW. G., Appl. Spectrosc.36, 155 (1982).
4.
BrimmerP. J.GriffithsP. R., and HarrickN. J., Appl. Spectrosc.40, 258 (1986).
5.
FullerM. P. and GriffithsP. R., Anal. Chem.50, 1906 (1978).
6.
WoodB. E.PipesJ. G.SmithA. M., and RouxJ. A., Appl. Opt.15, 940 (1976).
7.
KubelkaP. and MunkF., Z. Techn. Phys.12, 593 (1931).
8.
KortümG., Reflectance Spectroscopy (Springer, New York, 1969), Chap. IV.
9.
YangP. W.MantschH. H., and BaudaisF., Appl. Spectrosc.40, 974 (1986).
10.
HirschfeldT., Appl. Spectrosc.40, 1082 (1986); KorteE., “Figures of Merit for a Diffuse Reflectance Accessory Using an On-Axis Ellipsoidal Collecting Mirror,”to appear in Appl. Spectrosc.42(2) (1988).
11.
HarringtonJ. A. and SparksM., Opt. Lett.8, 223 (1983).
12.
HarringtonJ. A. and StandleeA. G., Appl. Opt.22, 3073 (1983).
