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Abstract

A method for determining the optical properties (transmittance, reflectance, absorptance) with respect to thermal infrared radiation, and by extension of radiation from a number of other sources, is described and demonstrated by application to polymer films. A procedure for operation of the method on a Perkin Elmer 3600 Data Station interfaced to a Perkin Elmer 580B infrared spectrophotometer is described.

Keywords

Thermal radiative properties transmittance reflectance absorptance emissivity Infrared spectroscopy Computer applications Polymer films

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References

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A Method for Determining the Optical Properties of Materials with Respect to Thermal Radiation and Radiation from a Number of other Sources

Abstract

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