The removal of secondary and tertiary interferograms from the main interferogram in Fourier transform spectroscopy can lead to an implicit apodization of the specimen interferogram. This effect can result in the generation of unwanted artifacts in the specimen's transmittance or absorption spectrum. One approach for avoiding this problem is to use an apodization function on the background and reference interferograms which matches the function used on the specimen interferogram.
BaghdadiA. and FormanR. A., Appl. Spectrosc.35, 473 (1981).
2.
MeadD. G. and LowryS. R., Appl. Spectrosc.34, 167 (1980).
3.
KulkarniM. V., at a panel discussion on FTIR at the Semicon-West meeting, May 1982.
4.
HirschfeldT. and MantzA. W., Appl. Spectrosc.30, 552 (1976).
5.
LeroueilleJ., Appl. Spectrosc.36, 153 (1982).
6.
ClarkF. R. S. and MoffatD. J., Appl. Spectrosc.32, 547 (1978).
7.
This is the method used by the Nicolet software for eliminating interference fringes in spectra obtained from silicon wafers. Nicolet* Instrument Corporation, Madison, WI. It is also the procedure outlined in the instruction manual for a Nicolet 7199 Fourier transform spectrophotometer.
8.
RaboltJ. F. and BellarR., Appl. Spectrosc.35, 132 (1981).
9.
BellR. J., Introductory Fourier Transform Spectroscopy (Academic Press, New York, 1972), p. 55.
10.
GrasselliJ. G.GriffithsP. R., and HannahR. W., Appl. Spectrosc.36, 87 (1982).
11.
HrostowskiH. J. and KaiserR. H., Phys. Rev.107, 966 (1957).
12.
FreelandP. E., J. Electrochem. Soc.127, 754 (1980).
13.
ShimuraS. F.OhnishiY., and TsuyaH., Appl. Phys. Lett.38, 867 (1981).
