A simple method for estimating the amount of pressure-induced polarization scrambling by optical windows in the high pressure Raman scattering cells is proposed. This method is based on the measurement of the depolarization ratio ρ for a polarized band (ρ = 0) for which a nonzero value of ρ is produced by the leakage of the Ivv component due to stress-induced birefringence of the window material. As an illustrative example the measurement of ρ for the polarized ν3(A1) band in liquid tetramethyltin is presented.
