The thickness effect is treated using a simplified form for the window function and the absorption edge. It is shown that for the low absorbing portion of the K edge the relative error caused by the tail of the window function becomes larger, rather than vanishing, in the limit of zero thickness foils. A means is described and experimentally demonstrated for separating changes in K absorption edge fine structure due to alloying from those due to the thickness effect.
ParrattL. G.HempsteadC. F., and JossenE. L., Phys. Rev.105, 1228 (1957).
2.
NemnonovS. A. and SorokinaM. F., Bull. Acad. Sci. USSR24, 462 (1960).
3.
SchnopperH., Ph.D. dissertation, Cornell University (1962).
4.
PorteusJ. O., J. Appl. Phys.33, 700 (1962).
5.
DasB. N. and AzároffL. V., Acta Met.13, 827 (1965).
6.
PeaseD. M., Ph.D. dissertation, University of Connecticut (1972).
7.
It should be pointed out that with respect to the criteria of statistical accuracy in the data, one should not go the thinnest foil possible; rather, an optimum foil thickness exists. This problem has been treated in detail by NordforsB., Ark. Fys.18, 37 (1960).
8.
GregoryT. K. and BestP. E., Advan. X-ray Anal.15, 90 (1971).
9.
YehH. C. and ArároffL. V., J. Appl. Phys.38, 4034 (1967).
