Various possibilities of Auger and photoelectron spectroscopy as an analytical technique are discussed. In some applications simple electrostatic analyzers with coarse resolution may suffice and even be preferable. Typical spectra obtained with a hemispherical electrostatic analyzer of 0.6% energy resolution are presented and discussed. Such factors as sample thickness, sample potential, surface contamination, and incident angle of the exciting x rays have been found to affect the quality and character of the observed spectra. These results characterize some of the features, problems, and capabilities of applied Auger and photoelectron spectroscopy.
Get full access to this article
View all access options for this article.
References
1.
SiegbahnK., Physica8, 1043 (1952).
2.
SiegbahnK. and EdvardsonK., Nucl. Physics.1, 137 (1956).
3.
SiegbahnK., ESCA, Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy (Royal Society of Sciences of Uppsala, 1967).
4.
HagströmS.NordlingC., and SiegbahnK., Z. Physik.178, 439 (1964).
5.
AxelsonG., Nature213, No. 5071, 70 (1967).
6.
FadleyC.HagströmS.HollanderJ.KleinM., and ShirleyD., UCRL—17426 (1967).
7.
FahlmanA.HamrinK.NordbergB.NordlingC., and SiegbahnK., Phys. Letters20, 159 (1966).
8.
HenkeB. L., AFSOR—1995 (1962), and Appendix II, Geometrical Optics.
9.
NordlingC.HagströmS., and SiegbalmK., Z. Physik.178, 433 (1964).
10.
HarrisL. A., Ind. Res.10, No. 2, 52 (1968).
11.
FinkR. W.JopsonR. C.MarkH., and SwiftC. D., Rev. Mod. Phys.38, 513 (1966) and references cited therein.
12.
MehlhornW., Z. Physik.160, 247 (1960).
13.
MelhornW., Z. Physik.187, 21 (1965).
14.
MehlhornW.StalhermD., and VerbeekH., Z. Naturforsch23a, 287 (1968).
15.
PurcellE. M., Phys, Rev.54, 818 (1938).
16.
AshbyN., Nucl. Instr.3, 90 (1958).
17.
RitchieR. H.ChekaJ. S., and BirkhoffR. D., Nucl. Instr. Methods6, 157 (1960).
HubbellH. H.McConnellW. J., and BirkhoffR. D., Nucl. Instr. Methods31, 18 (1964).
20.
RogersF. T.Jr., Rev. Sci. Instr.22, 723 (1951).
21.
CraigD. S.BrowneC. P., and WilliamsonR. M., Phys. Rev.81, 304 (1951); CraigD. S.BrowneC. P.DonahueD. J.WilliamsonR. M., and BenensonR. E., Phys. Rev.83, 203 (1951).
22.
BaderM.FryerT. B., and WittebornF. C., NASA TN D—1035 (1961).
23.
WolfeJ. H.SilvaR. W., and MyersM. A., J. Geophys. Res.71, 1319 (1966).
24.
PaoliniF. R. and TheodoridisG. C., Rev. Sci. Instr.38, 579 (1967).
25.
DeslattesR. D. and SimsonB. G., Rev. Sci. Instr.37, 753 (1966).
26.
YeeK. W. and DeslattesR. D., Rev. Sci. Instr.38, 637 (1967).
