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Simple Helium Enclosure for Increasing Diffraction-Line Detectability with a G.E. XRD-5 Diffractometer

Applied Spectroscopy

Impact Factor: 2.2 / 5-Year Impact Factor: 3.0

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First published online May, 1968

Simple Helium Enclosure for Increasing Diffraction-Line Detectability with a G.E. XRD-5 Diffractometer

Volume 22, Issue 3

https://doi.org/10.1366/000370268774383525

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