Abstract
A cascade spectrometer has been designed and constructed in which the ion beam traverses two successive 180° trajectories. This instrument differs from previous two-stage mass spectrometers in that a large single magnet (rather than tandem magnets) is utilized. Designed as a research rather than an analytical instrument, it provides for not only the analysis of ions from a primary source but also the identification of primary, secondary, or dissociated ions after the primary ion beam has interacted with a suitable target at the focal point of the first 180° 12-in. radius trajectory. Reflected and/or sputtered ions from the target traverse a second 180° trajectory and are detected by a semiconductor magnetic multiplier, which scans the entire focal plane. Isotopically resolved mass spectra of ions sputtered from pure metals and alloys have been obtained.
Get full access to this article
View all access options for this article.
