Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

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The samples have been prepared and measured in cooperation with J. Heberle at FZ Jülich, Germany.

Roodenko K. Gensch M. Heise H. M. Schade U. Esser N. and Hinrichs K , Infrared Phys. Technol., paper accepted (2005).

Hinrichs K. Gensch M. Nikonenko N. Pionteck J. and Eichhorn K.-J , Macromol. Sympos., paper submitted (2005).

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