Standard Reference Material 2036 Near-Infrared Reflection Wavelength Standard

Abstract

Standard Reference Material 2036 (SRM 2036) is a certified transfer standard intended for the verification and calibration of the wavelength/wavenumber scale of near-infrared (NIR) spectrometers operating in diffuse or trans-reflectance mode. SRM 2036 Near-Infrared Wavelength/Wavenumber Reflection Standard is a combination of a rare earth oxide glass of a composition similar to that of SRM 2035 Near-Infrared Transmission Wavelength/Wavenumber Standard and SRM 2065 Ultraviolet–Visible–Near-Infrared Transmission Wavelength/Wavenumber Standard, but is in physical contact with a piece of sintered poly(tetrafluoroethylene) (PTFE). The combination of glass contacted with a nearly ideal diffusely reflecting backing provides reflection–absorption bands that range from 15% R to 40% R. SRM 2036 is certified for the 10% band fraction air wavelength centroid location, ^10%B, of seven bands spanning the spectral region from 975 nm to 1946 nm. It is also certified for the vacuum wavenumber ^10%B of the same seven bands in the spectral region from 10 300 cm⁻¹ to 5130 cm⁻¹ at 8 cm⁻¹ resolution. Informational values are provided for the locations of thirteen additional bands from 334 nm to 804 nm.

Keywords

SRM 2036 Standard reference material Wavelength standard Wavelength calibration Reflectance spectroscopy Near-infrared Diffuse reflectance Optical filters

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References

Isaksson

Yang

Kemeny

G. J.

Jackson

R. S.

Wang

Alam

K. M.

and Griffiths

P. R

, Appl. Spectrosc. 57, 176 (2003).

Yang

Jackson

R. S.

Isaksson

and Griffiths

P. R

, J. Near Infrared Spectrosc. 11, 229 (2003).

Schott Glass Inc., Duryea, PA, as special melt S8851.

Choquette

S. J.

Travis

J. C.

and Duewer

D. L

, Proc. SPIE-Int. Soc. Opt. Eng. 3425, 94 (1998).

Duewer

D. L.

Choquette

S. J.

O'Neal

L. E.

and Filliben

J. J

, Anal. Chim. Acta 490, 85 (2003).

Choquette

S. J.

O'Neal

L. E.

and Duewer

D. L

, Anal. Chem. 75, 961 (2003).

Standard Reference Material SRM 2065; National Institute of Standards and Technology; Gaithersburg, MD, 2002. http://srmcatalog.nist.gov/SRM2035.

Standard Reference Material SRM 2035; National Institute of Standards and Technology; Gaithersburg, MD, 1999. http://srmcatalog.nist.gov/.

Standard Reference Material SRM 2036, National Institute of Standards and Technology, Gaithersburg, MD, USA, 2003, http://srmcatalog.nist.gov/SRM2036 Certificate of Analysis.

10.

Hanssen

L. M.

and Kaplan

, Proc. SPIE-Int. Soc. Opt. Eng. 3425, 16 (1998).

11.

Gilbert

S. L.

and Swann

W. C

, “Standard Reference Materials: Acetylene C2H2 Absorption Reference for 1510 nm-1540 nm Wavelength Calibration—SRM 2517.” NIST special publication 260–133 (1997).

12.

Guelachvili

and Rao

K. N

, Handbook of Infrared Standards II (Academic Press, San Diego, CA, 1993).

13.

Weidner

V. R.

Barnes

P. Y.

and Eckerle

K. L

, NBS J. Res. 91, 243 (1986).

14.

Cameron

D. G.

Kauppinen

J. K.

Moffat

J. K.

and Mantsch

H. H

, Appl. Spectrosc. 36, 245 (1982).

15.

Zhu

and Hanssen

L. M

, 11th International Conference of Fourier Transform Spectrometry, AIP proceedings 430, De Haseth

J. A.

Ed. (American Institute of Physics, New York, 1998), pp. 491–494.

16.

Zhu

and Hanssen

L. M

, Proc. SPIE-Int. Soc. Opt. Eng. 3425, 111 (1998).

17.

Standard Practice for Describing and Measuring Performance of Fourier Transform Mid-Infrared (FT-MIR) spectrometers: Level Zero and Level One Tests. Annual Book of Standards 2005, vol 3.06, E1421–99, 447–458.

18.

Guide to the Expression of Uncertainty in Measurement, ISBN 92-67-10188-9, 1st Ed. ISO, Geneva, Switzerland, (1993): See also Taylor

B. N.

and Kuyatt

C. E

, “Guidelines for Evaluating and Expressing The Uncertainty of NIST Measurement Results,” NIST Technical Note 1297 (U.S. Government Printing Office, Washington, D.C., 1994).

19.

May

Parris

Beck

C. M.

Fassett

Greenberg

Guenther

Kramer

Wise

Gills

Colbert

Gettings

and MacDonald

, Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurement, NIST Special Publication 260–136 (U.S. Government Printing Office, Washington, D.C., 2000).

20.

www.brukeroptics.com, and documentation for reference standards herein.

21.

Travis

J. C.

Zwinkels

J. C.

Mercader

Ruiz

Early

E. A.

Smith

M. V.

Noel

Maley

Kramer

G. W.

Eckerle

K. L.

and Duewer

D. L

, Anal. Chem. 74, 3408 (2002).

22.

http://ts.nist.gov/traceability/.